Abstract
Magnetization reversal processes in epitaxial NiO/NiFe bilayers were studied using the magneto-optic indicator film technique. The influence of dislocations on these processes was determined. Remagnetization parallel to the unidirectional anisotropy axis proceeds by domain nucleation and growth, with nucleation center activity being asymmetric with respect to the applied field sign. Magnetization reversal in the hard axis direction occurs by incoherent rotation. The enhanced coercivity and asymmetric nucleation can be explained by taking into account domain wall behavior in the antiferromagnetic layer.
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