Abstract
Silicon oxynitride (SiON) layer and SiO2 buffer layer were deposited on silicon wafers by PECVD technique using SiH4, N2O and N2. The refractive index of SiON films measured at a wavelength of 1552 nm using a prism coupler, could be continuously varied from 1.4480 to 1.4508. Optical planar waveguides with a thickness of 6 μm and a refractive index contrast (Δn) of 0.36% have been obtained. In addition, etching experiments were performed using ICP dry etching equipment on thick SiON films grown on Si substrates covered with a thick SiO2 buffer layer. In order to measure optical properties, a polarization maintaining single-mode fiber was used for the input and a microscope objective for the output at 1.55 μ m. A low-loss and low propagation SiON-based waveguide was fabricated with easily adjustable refractive index of core layer.
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