Abstract
Fourier ptychography microscopy (FPM) is a phase retrieval technique, which can simultaneously realize a large field of view and high spatial resolution. Most of the related improved works of FPM focus on system construction and algorithm improvement. Several parameters such as adjacent sub-spectrum overlap ratio and recovery sequence affect the performance of the FPM framework too. In this letter, we propose an asymmetric constraint Fourier ptychography microscopy (ACFPM) framework. We demonstrate the feasibility and efficiency of the proposed framework through simulations and actual experiments. Results indicate that introducing asymmetry in the Fourier domain without considerable influence on sub-spectrum overlap ratio can evidently improve the reconstruction quality of high-resolution image.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
