Abstract
Solder interconnect reliability is exceedingly influenced by the solder material properties, the intermetallics formed during soldering, and the environmentally imposed loads. The current study involves the study of the wetting behaviour, interfacial reactions and growth of intermetallic compounds (IMCs) in Sn–2.5Ag–0.5Cu lead free solder solidified on Cu substrate as function of reflow time. The reflow temperature was maintained at 270 °C and reflow time was varied from 10 to 10,000 s. The solder alloy showed better wettability on the substrate with the increase in reflow time. A growth in Cu6Sn5 IMC thickness was observed up to a reflow time of 500 s. IMC layer formed during a reflow time of 10 s was 3.09 μm and its thickness increased to 4.40, 8.21, 10.96 μm during 100, 300 and 500 s reflow time respectively. A decrease in the thickness of IMC was observed for samples reflowed for 1000 s. The IMC thickness increased with further increase in reflow time. The joint reliability of Sn–2.5Ag–0.5Cu solder solidified on copper substrate surfaces was assessed by performing bond shear test. The average shear strength decreased with an increase in reflow time after an optimum value.
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