Abstract

PurposeTo investigate ion recombination correction and polarity effects in four ion chamber models in flattening-filter-free (FFF) beams to (1) evaluate their suitability for reference dosimetry; (2) assess the accuracy of the two-voltage technique (TVA) against the Bruggmoser formalism; and (3) examine the influence of the accelerator type on the recombination correction. MethodsJaffé plots were created for a variety of microchambers, small-volume and Farmer-type chambers to obtain kS, the recombination correction factor, using two different types of accelerators. These values were plotted against dose-per-pulse and Jaffé plots for opposite polarities were created to determine which chambers meet the AAPM TG-51 addendum recombination and polarity specifications. ResultsNearly all small-volume chambers exhibited reference-class behavior with respect to ion recombination and polarity effects. The microchambers exhibited anomalous recombination and polarity effects, precluding their use for reference dosimetry in FFF beams. For the reference-class chambers, agreement between TVA-determined kS values and Jaffé and Bruggmoser formalisms-determined kS values was within 0.1%. No significant differences were found between the kS values obtained with the two different accelerators used in this work. ConclusionsThis study stresses the need to characterize ion recombination correction and polarity effects for small-volume chambers and microchambers on an individual chamber basis and with the more rigorous criteria of the AAPM TG-51 addendum. Furthermore, the study demonstrated the suitability of the TVA method for chambers that exhibit reference-class behavior in FFF beams. Finally, this work has shown that the recombination correction does not depend on the type of accelerator but on its dose-per-pulse.

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