Abstract
Random amplified polymorphic DNA (RAPD) markers and microsatellite markers were used to characterize the genetic diversity among sugarcane cultivars with different levels of resistance to top borer and to derive associations between top borer resistance / susceptibility and RAPD and SSR markers. Three bulked DNA from resistant, moderately resistant and highly susceptible lines were used to screen polymorphic primers. Of the 125 primers screened 62 primers generated polymorphic profiles. Analysis of individual varieties with the polymorphic primers, resulted in genetic similarity values ranging from 55.8% to 83.4% with a mean genetic similarity of 68.3%. Cluster analysis resulted in a dendrogram with two major clusters separating the resistant and moderately resistant cultivars from the highly susceptible cultivars. Associations between the markers and top borer resistance / susceptibility detected five markers viz., OPC201020, NKS7186, NKS8334, NKS61221 and NKS9615 in resistant varieties and two markers NKS5684 and OPV17917 in susceptible varieties. Further testing of these markers on a set of foreign hybrids that were phenotypically tested for resistance, identified three markers viz., NKS7186, NKS61221 and OPV17917 that will be useful for top borer screening and further mapping studies.
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