Abstract

Today's advanced science and technology has witnessed extensive efforts put forth by researchers whose persistent work has been continuing quite consistently to find high shock resistant and technologically important device materials. Ferrites are right at the top in terms of contribution for the making of modern electronic and spintronics devices which are predominantly used in magnetic sensors as well as data storage applications. On the other hand, several ferrite materials do not fulfill the real practical requirements of the device engineers even though they have the required functional properties for device fabrications. Hence, the journey of finding ideal materials for device fabrication is still an ongoing arduous process. On this context, we have made systematic investigation of unearthing and understanding the properties and especially the stability of MnFe2O4 NPs at shock wave loaded conditions. Powder X-ray diffractometer (PXRD), Ultra-Violet diffuse reflectance spectroscopy (UV-DRS) and vibrating sample magnetometer (VSM) techniques have been undertaken so as to find out the crystallographic, electronic and magnetic phase stabilities at shocked conditions. The observed XRD, UV-DRS and VSM studies reveal that the title ferrite NPs has high shock resistant behavior so that it is suggested for the application of device fabrication.

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