Abstract
High-efficiency silicon solar cells are well known to have high “capacitance,” in the sense of having a slow time response to changes in voltage or current. This is often seen during power measurements of cells or modules. This issue is increasingly important as high-efficiency cells such as p -type passivated-emitter rear contact (PERC) and n -type heterojunction cells become more common within the industry. A fundamental understanding of solar cell device physics is essential to evaluate the various test methods used to accurately measure device power output under transient conditions during flash testing. This paper offers a simple device physics framework that is sufficient to understand a wide variety of test conditions and evaluate test solutions for cell or module output power measurements.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
