Abstract
The purpose of this pilot study was to assess hemianopic visual field defects objectively in individuals with stroke using the pattern, visual-evoked potential (VEP) technique. Subjects were comprised of 5 adults with documented hemianopic visual field defects. The central field and the intact hemi-field VEP amplitudes were significantly larger than found in the hemianopic field (p < 0.05). However, latency values were similar (p > 0.05). The objective pattern VEP has the potential to be used rapidly and reliably to detect for the presence of hemianopic visual field defects in stroke patients.
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