Abstract
The adsorption of asphaltenes onto flat silica surfaces modified with self-assembled monolayers (SAMs) of alkyltrichlorosilanes of varying thickness due to a variable number of carbon atoms (N(C)) has been studied by means of contact angle measurements, spectroscopic ellipsometry, and near-edge X-ray absorption fine structure spectroscopy. The extent of asphaltene adsorption was found to depend primarily on the ability of the SAM layer to shield the underlying silicon substrate from interacting with the asphaltenes present in solution. Specifically, asphaltene adsorption decreased with an increase in N(C) and/or an increase in SAM grafting density, sigma(SAM), (i.e., number of SAM molecules per unit area). The effect of the solvent quality on the extent of asphaltene adsorption was gauged by adsorbing asphaltenes from toluene, 1-methylnaphthalene, tetralin, decalin, and toluene-heptanes mixtures. The extent of asphaltene adsorption was found to increase proportionally with a decrease in the Hildebrand solubility parameter of the solvent.
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