Abstract
This study presents a real-time method for determining the thickness of each layer in multilayer thin films. Artificial neural networks (ANNs) were introduced to estimate thicknesses from a transmittance spectrum. After training via theoretical spectra which were generated by thin-film optics and modified by noise, ANNs were applied to estimate the thicknesses of four-layer nanoscale films which were TiO2, Ag, Ti, and TiO2 thin films assembled sequentially on polyethylene terephthalate (PET) substrates. The results reveal that the mean squared error of the estimation is 2.6 nm2, and is accurate enough to monitor film growth in real time.
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