Abstract

This paper deals with the extension of the artificial material single-layer (AMSL) method, recently developed to model electromagnetically a thin conductive material using the finite-element method (FEM), to the more general case of transversally anisotropic shields. The analogy between the field equations and the multiconductor transmission line (MTL) equations is here used to calculate the admittance matrix of a thin anisotropic material. This admittance matrix is then imposed to be that of an equivalent circuit with lumped parameters. Thus, it is possible to synthetize the AMSL tensors containing the specific constants to be used in commercial software tools. The adoption of the AMSL method in FEM simulations avoids a fine discretization inside the thin conductive anisotropic material required at high frequency. Simple tests are finally carried out to validate the proposed method.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.