Artificial immune algorithm-based approach to recognizing unnatural patterns among autocorrelated characteristics

Abstract

A control chart is a tool for statistical process control (SPC) used to determine variations in manufacturing processes resulting from common or assignable causes. The presence of unnatural patterns in control charts is an indication that the process has been influenced by assignable causes, and corrective actions must be taken. However, the assumption of uncorrelated or independent observations is not suitable for all of the characteristics pertaining to a product. This study presents a method with which to improve the accuracy of pattern recognition in control charts, through the autocorrelation of product characteristics. Particularly, we developed an artificial algorithm-based machine learning model to recognize unnatural patterns and processes in AR(1) simultaneously. The proposed method integrates an artificial immune system and support vector machine within a recognition system. This study evaluated the accuracy with which four patterns could be recognized. The four patterns include trends, sudden shifts, cyclic patterns, and normal patterns. Identifying unnatural patterns can greatly narrow the range of possible causes that must be investigated, thereby speeding up the diagnostic processes. Key words: Pattern recognition, artificial immune algorithm, support vector machine, autocorrelation.