Abstract
AbstractArtifacts dominate atomic force microscope (AFM) images of nanoporous and mesoporous inorganic oxide materials taken under ambient atmospheric conditions with currently available tips. Artifacts in these AFM images are attributed to tip-sample interactions and the sharpness of tips on currently available cantilevers. We show that by modifying currently available AFM tips with carbonaceous materials, many image artifacts are eliminated. To characterize image artifacts, a variety of fiducial samples with feature sizes between ∼100 Å and 2,000 Å are used. One of the most useful fiducial samples is a close packed array of holes in a commercially available alumina membrane and we suggest that it be adopted as a standard fiducial sample.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
