Abstract
As with any other microscopic technique, in atomic force microscopy (AFM), problems can arise. Some of these happen due to improper use of the microscope by the operator, and some are due to particular characteristics of the sample. Some occur depending on the type of instrument, or from probe damage. Some of them are artifacts inherent in the technique. Knowledge of these issues is important for correct data acquisition and interpretation, and in many cases, training in AFM is inadequate. In this chapter we show examples of common artifacts in AFM and describe, where possible, how to overcome them. Other practical issues important for best practice in AFM operation, such as noise reduction and data processing, are also discussed.
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