Abstract
Vacancy-mediated transport drives the functionality of oxide-based nonvolatile memristive devices. Here, we report the size dependence of TiO2/Nb:STO heterojunctions for electroforming and the subsequent resistive switching process. Conductive AFM measurements suggest that the forming and reset voltages both decrease with increasing junction size. We also show oxygen flow ratio changes during fabrication, and post-annealing impacts the set voltage and resistance ratio through changes in available oxygen vacancies. Finally, a polarity reversal between eight-wise and counter-eight-wise switching occurs after vacuum and ambient anneals, thus modulating oxygen vacancy availability and changing (reversibly) the mechanism from vacancy migration to an electron trap/detrap process.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
