Abstract
An important technique used to characterize field emission is the measurement of the emitted current against electric field (I×E). In this work we discuss a procedure for obtaining I×E data based on multiple approach curves. We show that the simulated features obtained for an idealized uniform surface matches available experimental data for small anode–cathode distances, while for large distances the simulation predicts a departure from the linear regime. We also discuss the shape of the approach curves for large anode–cathode distances for a cathode made of carbon nanotubes.
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Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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