Applying the Inelastic Thermal Spike Model to the Investigation of Damage Induced by High‐Energy Ions in Polymers

Abstract

AbstractThis work reports on damage production in polymers by high‐energy ions within the framework of the inelastic thermal spike model (i‐TS). The model is used to describe the effective size of the damaged region around the ion path (the track size) in amorphous poly(methyl methacrylate) (PMMA) and the semicrystalline poly(p‐phenylene sulphide) (PPS), poly(ethylene terephthalate) (PET), and poly(vinylidene difluoride) (PVDF). Track size calculations are compared to experimental data deduced from measurements of crater size, bond‐breaking cross‐sections, changes in crystallinity and electron density, track etching, and electrical depolarization. The use of data obtained from distinct types of damage provides a broad platform to test the applicability of the model to polymers. This work shows that the i‐TS correctly describes the dependence of the track size on energy loss obtained from most experimental probes, when the activation energy of thermal decomposition of the polymers is used as the criterion of track formation, using an electron–phonon mean free path of ≈3 nm. As damage is not uniform across the ion track radial dimension, there are fine variations in the experimental damage radii that can only be accounted for by using multiple activation processes. Amorphization radii of the semicrystalline polymers are not directly correlated to melting induced by the ions.