Applying Advanced Lightweight Architecture DSGSE-Yolov5 to Rapid Chip Contour Detection

Abstract

Chip contour detection aims to detect damaged chips in chip slots during IC packaging and testing using vision facilities. However, the operation speed of the new chip transportation machine is too fast, and the current chip contour detection models, such as Yolov5, M3-Yolov5, FGHSE-Yolov5, and GSEH-Yolov5, running on the embedded platform, Jetson Nano, cannot detect chip contours in a timely manner. Therefore, there must be a rapid response for chip contour detection. This paper introduces the DSGSE-Yolov5s algorithm, which can accelerate object detection and image recognition to resolve this problem. Additionally, this study makes a performance comparison between the different models. Compared with the traditional model Yolov5, the proposed DSGSE-Yolov5s algorithm can significantly promote the speed of object detection by 132.17% and slightly increase the precision by 0.85%. As a result, the proposed approach can outperform the other methods.