Abstract

Using recently-developed THz emitters constructed from single crystals of the high-Tc superconductor Bi2Sr2CaCu2O8+δ, we performed three prototype tests of the devices to demonstrate their unique characteristic properties for various practical applications. The first is a compact and simple transmission type of THz imaging system using a Stirling cryocooler. The second is a high-resolution Michelson interferometer used as a phase-sensitive reflection-type imaging system. The third is a system with precise temperature control to measure the liquid absorption coefficient. The detailed characteristics of these systems are discussed.

Highlights

  • The intrinsic Josephson junction (IJJ)-THz emitting device is made from a piece of a single crystal of Bi2212 grown by a traveling-solvent floating-zone method

  • We presented here three THz measurement systems for applications using a stand-alone mesa sandwich IJJ-THz emitter

  • A Michelson type of interferometer based on a reflection type of THz imaging system was shown

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Summary

Introduction

Temperature and current dependencies of terahertz emission from stacks of intrinsic Josephson junctions with thin electrodes revealed by a high-resolution FT-IR spectrometer. H. et al Hot spots and waves in Bi2Sr2CaCu2O8+δ intrinsic Josephson junction stacks: a study by low temperature scanning laser microscopy. B. et al Hot-spot formation in stacks of intrinsic Josephson junctions in Bi2Sr2CaCu2O8+δ. B. et al Coherent terahertz emission of intrinsic Josephson junction stacks in the hot spot regime. S. et al Interaction of hot spots and terahertz waves in Bi2Sr2CaCu2O8+δ intrinsic Josephson junction stacks of various geometry. M. et al Dynamic control of temperature distributions in stacks of intrinsic Josephson junctions in Bi2Sr2CaCu2O8+δ for intense terahertz radiation. M. et al Linewidth dependence of coherent terahertz emission from Bi2Sr2CaCu2O8+δ intrinsic Josephson junction stacks in the hot-spot regime.

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