Abstract
A small polished rectangular block of natural diamond unusually free from impurity zoning was examined by birefringence and synchrotron X-ray topography to map internal defects and assess effects of some accidental mechanical damage. ;Orthogonal-view' projection topographs facilitated comparisons between optical and X-ray images. Speedy and precise positioning of crystal sections cut in synchrotron X-ray section topographic studies was aided by radiographic and fluoroscopic procedures, which are described. Several X-ray reflection and refraction phenomena are illustrated, including high-contrast refraction images of crystal edges, chipping and crack outcrops. It was demonstrated that by combining optical and X-ray goniometry it was possible to record Pendellösung fringe systems employing precisely selected X-ray wavelengths in well defined crystal volumes. Valuable gain in fringe visibility resulted from the use of pure sigma-mode polarized synchrotron radiation. Absolute values of the diamond 004 structure factor were derived from five fringe systems measured, the findings (in upward order) being 11.7, 11.7, 12.0, 12.5, 12.6. Their scatter greatly exceeds the uncertainty in the measurement procedure (believed to be within +/-1%) and is attributed to different strain distributions within the five volumes sampled.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
