Abstract
Full aperture interferometric metrology has enabled fabrication and verification of large primary mirrors with nm precision. The measurement of mirrors that are several meters in diameter with flat or convex aspheric surfaces can be performed using interferometric measurements of overlapping subaperture regions, then stitching the date from these measurements together to provide a full map. This paper explores the application of this measurement technique for very large mirrors, and discusses issues for measuring large flat or convex mirrors.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
