Abstract

Scanning electron microscopy (SEM) has contributed to elucidating the ultrastructure of bio-specimens in three dimensions. SEM imagery detects several kinds of signals, of which secondary electrons (SEs) and backscattered electrons (BSEs) are the main electrons used in biological and biomedical research. SE and BSE signals provide a three-dimensional (3D) surface topography and information on the composition of specimens, respectively. Among the various sample preparation techniques for SE-mode SEM, the osmium maceration method is the only approach for examining the subcellular structure that does not require any reconstruction processes. The 3D ultrastructure of organelles, such as the Golgi apparatus, mitochondria, and endoplasmic reticulum has been uncovered using high-resolution SEM of osmium-macerated tissues. Recent instrumental advances in scanning electron microscopes have broadened the applications of SEM for examining bio-specimens and enabled imaging of resin-embedded tissue blocks and sections using BSE-mode SEM under low-accelerating voltages; such techniques are fundamental to the 3D-SEM methods that are now known as focused ion-beam SEM, serial block-face SEM, and array tomography (i.e., serial section SEM). This technical breakthrough has allowed us to establish an innovative BSE imaging technique called section-face imaging to acquire ultrathin information from resin-embedded tissue sections. In contrast, serial section SEM is a modern 3D imaging technique for creating 3D surface rendering models of cells and organelles from tomographic BSE images of consecutive ultrathin sections embedded in resin. In this article, we introduce our related SEM techniques that use SE and BSE signals, such as the osmium maceration method, semithin section SEM (section-face imaging of resin-embedded semithin sections), section-face imaging for correlative light and SEM, and serial section SEM, to summarize their applications to neural structure and discuss the future possibilities and directions for these methods.

Highlights

  • Scanning electron microscopy (SEM) enables images to be obtained by detecting various signals [e.g., secondary electrons (SEs), backscattered electrons (BSEs), X-ray, and cathodoluminescence)] that escape from specimens when an incident electron probe emitted from an electron gun strikes the observation targets

  • When specimens prepared for the osmium maceration method are examined using high-resolution field emission (FE)-SEM, the 3D ultrastructure of organelles can be observed on the fractured surface of tissues, much like the schematic drawings found in textbooks

  • The osmium maceration method allows the direct observation of the 3D morphological feature of organelles in nerve tissues, which include the soma of nerve cells, myelin, axons, glial cells, and Schwann cells, especially their surface texture and spatial organization (Koga and Ushiki, 2006; Takahashi-Iwanaga and Iwanaga, 2011; Nomura et al, 2013)

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Summary

Introduction

Scanning electron microscopy (SEM) enables images to be obtained by detecting various signals [e.g., secondary electrons (SEs), backscattered electrons (BSEs), X-ray, and cathodoluminescence)] that escape from specimens when an incident electron probe emitted from an electron gun strikes the observation targets. Among these signals, both SE and BSE signals are most commonly used in biological and biomedical research. SEs are emitted near the surface of specimens and provide surface information on tissues and cells. More SEs escape from projections, such as microvilli than from the flat surface of specimens. A common feature of these SEM methods is the removal or digestion of unnecessary structures from bulk specimens for visualizing the structures of interest in tissues

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