Abstract
SummaryA diagnostic technique is proposed to detect major gene effects and other systematic departures from a model for the trait means in the presence of outliers. The technique is based on the examination of residuals from fitting variance components models to quantitative pedigree data using robust statistical procedures. The approach is demonstrated using the total ridge count and ridge count of the middle finger from 54 extended families affected with the Fragile X syndrome, and a sample of 217 normal pedigrees.
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