Applications of Nuclear Techniques, Computer Simulation and Microscopy to Depth Profiling of Light Nuclei

Abstract

There is a wide range of surface analysis techniques which are, generally, complementary and provide target information for depths near the surface. Nuclear techniques, which are non-destructive, provide for analysis over a few microns close to the surface giving absolute values of concentrations of isotopes and elements. They have been applied in areas such as scientific, technologic, industry, arts and medicine, using MeV ion beams. Nuclear reactions permit tracing of isotopes with high sensitivities. We use ion-ion reactions and the energy analysis method. At a suitable energy of the incident ion beam, an energy spectrum is recorded of ions from the reaction, coming from several depths in the target. Such spectra are computationally predicted, giving target composition and concentration profile information. Elastic scattering is a particular and important case. A computer program has been developed in this context, mainly for flat targets. The non-flat target situation arises as an extension.