Abstract
Journal Article Applications of MeV ion beams and microscopy to non-destructive surface analysis of materials Get access J Pacheco de Carvalho, J Pacheco de Carvalho Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, PortugalUnidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal Search for other works by this author on: Oxford Academic Google Scholar C F R Pacheco, C F R Pacheco Unidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal E-mail : pacheco@ubipt Search for other works by this author on: Oxford Academic Google Scholar A D Reis A D Reis Departamento de Física, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, PortugalUnidade de Detecção Remota, Universidade da Beira Interior, Rua Marquês d’Ávila e Bolama, 6201-001 Covilhã, Portugal Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S6, 1 August 2015, Pages 122–123, https://doi.org/10.1017/S1431927614014317 Published: 10 September 2015
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