Abstract
This chapter discusses the development of innovative room-temperature x-ray semiconductor detector technologies based on cadmium telluride (CdTe) and cadmium zinc telluride (CZT) pixellated arrays electrically connected to application specific integrated circuit (ASIC) readouts for energy-dispersive photon counting and spectroscopic x-ray imaging applications. This chapter begins with an introduction to two distinct readout methods, used to perform either energy-dispersive photon-counting pulse height discrimination (PHD) at high flux or spectroscopic pulse height analysis (PHA), for transmission or emission and scattering imaging respectively. Then devices and results from linear and area arrays of both types of x-ray imaging detectors, with the transmission detectors providing highly efficient high flux photon-counting capabilities with sufficiently good energy-dispersive characteristics (energy resolution) for multi-energy attenuation imaging, and the emission and scattering detectors providing high spatial resolution spectroscopic capabilities with extremely good energy resolution for radionuclide and/or diffraction imaging, are presented. Finally, a discussion of the geometries involved in the optimization of the semiconductors, ASICs, and readout schemes for each application is provided along with future efforts to integrate more readout functions closer to the pixels.
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