Application of X-ray microtomography in materials science illustrated by a study of a continuous fiber metal matrix composite

Abstract

The advantages of the use of x-ray microtomography in materials science are discussed, and illustrated by the nondestructive study of the mechanical damage in a continuous fiber SiC/Al composite at a resolution of about 25 μm. A laboratory x-ray source was used, and it was shown that quantitative measurements of the linear absorption coefficient at this resolution are possible, even though the Ag Kα radiation used is accompanied by a considerable amount of white radiation, provided that the counter system is properly corrected for pulse pile up and dead-time.