Application of x-ray excited optical luminescence to x-ray standing wave method and atomic resolution holography

Abstract

X-ray excited optical luminescence (XEOL) was applied to the x-ray standing wave (XSW) method and atom-resolved x-ray holography (XH). We measured the incident beam angular dependence of the luminescence intensity from a ZnO-coated ${\mathrm{Al}}_{2}{\mathrm{O}}_{3}$, and found that it corresponded to the XSW/XH pattern of ${\mathrm{Al}}_{2}{\mathrm{O}}_{3}$. The present result demonstrates that hard x-ray XSW/XH studies for light elements, which have been difficult by fluorescence detection, can easily be carried out by XEOL detection.