Application of X-ray Diffraction Methods to Studying Materials

Abstract

X-ray diffraction analysis methods and their application in studying materials, including nanomaterials, are reviewed. The physical phenomena served as the basis for these methods, the designs of the experimental apparatuses to be used to record X-ray diffraction patterns, and the algorithms of their analysis are considered. The advantages and disadvantages of each method are described, and advanced methods for investigating nanomaterials are proposed.