Abstract
White beam synchrotron X-ray topography (WBSXRT) has been used to characterize room temperature twinning structures in lanthanum gallate and P-terphenyl single crystals. Both Laue and Bragg geometries are utilized to reveal the nature of twinning in LaGaO 3. The geometric relationships between the twin related domains and the directions of the corresponding diffracted beams are used to establish the presence of reflection twins on (11̄2) orth, (11̄2̄) orth and (11̄0) orth planes. Also described is the application of WBSXRT to reveal the twin law in the solution grown organic crystal p-terphenyl. The active twin plane was unambiguously determined to be (201) by determination of the orientation relationship between parent and twinned structures through Laue pattern analysis. Twin lamellae with the same twin plane were also observed. For both materials, no radiation damage was observed throughout the experiments. These results demonstrate the usefulness of WBSXRT for the study of twins.
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