Abstract
This paper presents a new method of detecting Analog to Digital Converter harmonic distortion. The new method is based on Wavelet multi-resolution process to identify instantaneous harmonic components. In classical testing, Fourier transform algorithm was long adopted to estimate Total Harmonic Distortion by obtaining signal power spectrum. While the conventional method of Fourier transform tend to be complicated and lengthy, the new investigated algorithms of Wavelet transform has shown less computations process and instantaneous testing of ADCs harmonic distortions. By shorten testing times and reduced computation complexity, Wavelet transform can be particularly appropriate for developing ADCs low-cost, and fast testing procedure.
Highlights
Mixed signal devices provide the ability of transforming information across Analog and/or Digital domains as desired (Burns & Roberts, 2004; Akujuobi et al, 2007)
This paper presents a new method of detecting Analog to Digital Converter harmonic distortion
The new method is based on Wavelet multi-resolution process to identify instantaneous harmonic components
Summary
Mixed signal devices provide the ability of transforming information across Analog and/or Digital domains as desired (Burns & Roberts, 2004; Akujuobi et al, 2007). At most basic level, testing of mixed signal devices would seem simple matter; testing is extremely expensive, and time consuming as in (Akujuobi et al, 2007; Yamaguchi & Soma, 1997; Marshall & Akujuobi, 2002; Awada et al, 2010) for both static and dynamic parameter characterizations. In ADC’s operation, quantization errors cause nonlinearity effect that results into spectral frequencies other than the input frequency appear as random noise spread across the frequency spectrum. Such a distortion results in harmonic distortions and higher noise floor. With the focus on shortening testing process, reducing sample size, and simplifying testing process, Wavelet computations of ADCs THD was very close to conventional methods of FT
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