Abstract
The question of applying the TANDEM scheme for reconstructing flaw images by the SAFT method is considered. When the reflection of rays from a bottom is taken into account, it becomes possible to reconstruct the image of a boundary of a vertically oriented planar flaw. Formulas are proposed for calculating the optimal parameters of the scanning scheme for data collection according to the TANDEM scheme and the resolution is estimated. It is shown that the depth resolution for images obtained taking into account the reflection from the bottom is much worse than that for a direct beam. To increase the resolution, it is necessary to use coherent summation of images obtained for the same test object at different bases. This is confirmed by model experiments.
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