Application of the spreading of damage technique to the S=1/2 Ising thin film

Abstract

We apply the spreading of the damage technique to a S=1/2 Ising ferromagnetic thin film. We use Metropolis dynamics to calculate the temperature dependence of the Hamming distance as well as the Hamming distance distributions along the Markov chain. We suggest a modification of the algorithm for calculating the Hamming distance in the case of Metropolis dynamics and we discuss the results for the two-dimensional model obtained by the modified approach. For a film with three layers we present the thermal dependences of the above quantities. We also suggest a new way to introduce damage to the system as the difference in the boundary conditions. We discuss the results of this new approach for the two-dimensional model.