Application of the Single‐Kernel Characterization System to Durum Wheat Testing and Quality Prediction

Abstract

ABSTRACTThe Single Kernel Characterization System (SKCS 4100) measures single kernel weight, width, moisture content, and hardness in wheat grain with greater speed than existing methods and can be calibrated to predict flour starch damage and milling yield. The SKCS 4100 is potentially useful for testing applications in a durum improvement program. The mean SKCS 4100 kernel weight and moisture values from the analysis of 300 individual kernels gave good correlations with 1,000 kernel weight (r2 = 0.956) and oven moisture (r2 = 0.987), respectively. Although significant correlations were obtained between semolina mill yield and SKCS 4100 weight, diameter, and peak force, they were all very low and would be of little use for prediction purposes. Similarly, although there were significant correlations between some SKCS 4100 parameters and test weight and farinograph parameters, they too were small. The SKCS 4100 has been calibrated using either the single kernel hardness index or crush force profile to objectively measure the percentage vitreous grains in a sample with reasonable accuracy, and it correlates well with visual determination. The speed and accuracy of the test would be of interest to grain traders. An imprecise but potentially useful calibration was obtained for the prediction of semolina mill yield using the SKCS 4100 measurements on durum wheat. The SKCS 4100 is useful for some traits such as hardness, grain size and moisture for early‐generation (F3) selection in a durum improvement program.