Abstract
Scanning Kelvin microscopy (SKM) has been applied to the characterization of poled non-linear optical (NLO) polymer films, carbon black filled epoxy polymers and sulfur- passivated GaAs(100). This paper demonstrates that SKM is applicable to the detection of the magnitude and the direction of the field-induced polarization in poled NLO polymer films. We compare the response to that obtained from the scanning second-harmonic-microscopy method in which the direction of the orientation cannot be seen. A local illumination of the GaAs(100) surface during treatment in sodium sulfide solutions has significant influence on the work function distribution on the passivated surface. The image of the lateral distribution of the carbon black electrical network in epoxy resin by SKM is demonstrated.
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