Abstract

Defect parameter solution surface is a widely accepted method to determine the values of the energy level and the carrier capture cross sections of a defect from injection-dependent lifetime measurements. Results of the defect parameter solution surface come from the recognition of intersection points, which can be difficult when the doping or the temperature range of the measurement is narrow. In this paper, we introduce a new method to extract the defect parameters from lifetime spectroscopy data. After linearization of the Shockley–Read–Hall (SRH) lifetime equation, the problem is transformed into a mathematical form, which can be solved by the Newton–Raphson method. This method requires a much shorter computing time and directly provides the possible values of the defect parameters without user interaction, even for measurements with narrow doping and temperature ranges.

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