Abstract
A new technique is presented to determine the complex permittivity of each layer for a bi-layer dielectric material. The bi-layer material sample is loaded in a Ku-band rectangular waveguide and its two port S-parameters are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying the mode matching technique, expressions for the S-parameters of the bi-layer dielectric material as a function of complex permittivity of each layer are developed. To estimate the complex permittivity of each layer’s dielectric material, the square sums of errors between the measured and calculated S-parameters are minimised using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, and the average relative errors between the individual dielectric materials and those of each individual layer of the bi-layer dielectric materials are calculated.
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