Abstract
The divergent beam back reflection X-ray technique, known as Kossel diffraction, has been successfully applied in the scanning electron microscope. A simple camera is described which enables the patterns to be recorded with minimal alteration of the microscope. The camera is independent of the specimen stage controls and does not interfere with the normal operation of the microscope. The technique for obtaining the patterns is described and a typical pattern from iron reproduced to illustrate the signal to noise ratio. Results of experiments to determine exposure time as a function of film speed are included.
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