Abstract
A novel method combining the genetic algorithm (GA) and regular shape expansion technique is reported for electromagnetic imaging of a multilayer dielectric object of arbitrary shape. By measuring the scattered field, the shape, location, size, and permittivity of each layer of the object are retrieved quite successfully. The forward problem is solved based on the equivalent source current and the method of moments (MoM), while the inverse problem is reformulated as an optimization problem. The optimization problem is solved by the proposed method. Numerical simulation shows that good image reconstruction can be obtained for various multilayer dielectric objects as long as the noise level is ≤−20 dB. © 1999 John Wiley & Sons, Inc. Int J Imaging Syst Technol 10, 347–354, 1999
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