Abstract
The authors examine several attributes of a fault detection, isolation, and reconfiguration (FDIR) approach that is categorized as syndrome pattern matching. This approach is based on the premise that effective fault isolation algorithms must possess the capability of identifying patterns in the results of many fault detection tests, i.e., the fault syndrome. Examples of tests that constitute the syndrome are comparisons of redundant signals, hardware built-in test results and status indication from other systems or equipment. The syndrome pattern-matching method outlined presents a simple approach to implementing efficient and effective FDIR logic. Performance issues discussed include intermittent fault, multiple sequential failures, and unanticipated syndromes. >
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