Abstract
When systematic errors (external radiation, faults in drawing the background curve, too rough model or too strict constraints on the set of determined parameters, etc.) in gas electron diffraction are significant and comparable to random ones, it is necessary to modify the generally accepted statistical formulas used to estimate the errors of the fitted parameters. We present a modified computational procedure accounting for systematic errors in the input data and examples of parameter evaluation for molecules with internal rotation. In all these examples, the confidence intervals for the parameters become narrower.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
