Abstract
The technique of simultaneous identification of the basic components (except for oxygen) in high-temperature superconductor (HTSC) films is described. X-ray fluorescence analysis of the films was performed using a monochromatized SR beam from the VEPP-3 storage ring. To reduce the substrate background we used the method of complete reflection of exciting radiation from the surface of a sample. The layout of the device is depicted, and first results are reported. The technique can be applied to the identification of the contents of microimpurities in films and large HTSC samples.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
