Abstract
Synchrotron radiation (SR)-based soft X-ray (SX) microspectroscopy has been applied as a promising analytical method to investigate architectural structures that comprise ceramic-tile/adhesive/mortar-structured composite materials. Microprobe X-ray fluorescence (µXRF) spectra, elemental distribution maps and microprobe near-edge X-ray absorption fine structure (µNEXAFS) spectra were observed near each interface in the composite materials using an SX-beam with a beam size of 1–2 µm full-width at half-maximum (FWHM). Elemental distribution maps for O, Na, Mg, Al, and Si were obtained to clearly visualize the interfaces of the composite materials with pixel sizes of 10 and 1 µm with the aid of line profile analyses. When the photon flux of the focused SX-beam reached approximately 8 × 108 ph/s, the critical dose time () for the adhesive was estimated to be 30 min ( is the time at which the peak intensity of a specific chemical state in the µNEXAFS spectrum decreases to 1/e of the initial undamaged state due to radiation damage). We demonstrated the capability of the proposed method to survey local information regarding element-specific chemical states at the ceramic-tile/adhesive and adhesive/mortar interfaces before the adhesive is severely damaged due to the intense SX-beam.
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