Application of scanning electron microscopy in two-dimensional material characterization

Abstract

With the development of nanomaterials technology, scanning electron microscopy is widely used to investigate nanomaterials, providing a means to characterize materials at the nanoscale. This paper confronts the Scanning Electron Microscopy technique, which has important implications for studying two-dimensional nanomaterials. Firstly, this paper introduces the features and structure of Scanning electron microscopy, including the fast observation speed, high distinguishability, a wide range of analyses, the unique properties of two-dimensional nanomaterials, and preparation methods. Further, this paper discusses the application of scanning electron microscopy techniques in the characterization of two-dimensional materials, including imaging and analysis for the surface morphology and crystal structure, which solves the problem of the previous inability to characterize two-dimensional materials at the nanoscale. In addition, this paper highlighted the potential of scanning electron microscopy in facilitating the development of 2D materials applications in other fields and pointed out the further technique development requirements for using scanning electron microscopy as an advanced characterization method.