Application of resonance-enhanced X-ray standing waves to the study of layered structures by grazing-incidence X-ray reflectometry and secondary radiation

Abstract

Abstract In this work we present a review of results on reflectivity, fluorescence and photoelectron spectra investigated in layered samples, in which resonance-enhanced X-ray standing waves (RE–XSW) are formed. The new experimental results of photoelectron energy distribution excited in a thin carbon film deposited on a Ni mirror, as well as results obtained earlier, are compared and discussed. The new photoelectron measurements were performed using a conventional X-ray tube as radiation source for the energy Cu Kα (8047 eV), and recorded with a flow proportional electron counter of about 15% energy resolution. Also, new results of grazing-angle reflectivity from a X-ray waveguide sample recorded with a 13-keV synchrotron radiation is reported. Comparison of the results with theoretical models based on the Fresnel formula and Parratt recursive algorithm is done. The reflectivity and in-depth electric field distribution dependencies on wavelength, roughness, as well as composition of structures are calculated and compared to experimental spectra. The possible fields of application of the resonance-enhanced XSW to the study of layered structures, showing also some limitations inherent to the method are discussed.