Abstract

Application of Optimal Ellipsoid Fitting for Curvature Change Tracking in Main Reflector of Complex Antenna Structures

Highlights

  • Very long baseline interferometry (VLBI) is a technology for precisely determining the location of a measurement point by analyzing the differences in signal arrival time between observation stations

  • We propose a new curvature change tracking measurement technique based on a 3D geometrical model and close-range photogrammetry

  • The VLBI antenna is of the Cassegrain type, which consists of a main reflector with a diameter of 22 m and a subreflector with a diameter of 2.2 m

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Summary

Introduction

Very long baseline interferometry (VLBI) is a technology for precisely determining the location of a measurement point by analyzing the differences in signal arrival time between observation stations. Deviation from the design shape can introduce measurement biases, which influence VLBI observations This is because changes in the focal length of the main reflector or local deformations on the reflector’s surface directly result in biased signal paths and, biased baseline estimates.[1,2]. The techniques are generally not suited for tasks requiring a large number of measurement points distributed over an object surface or for complete surface measurements.[3] In these cases, close-range photogrammetry is a valuable alternative for the design of powerful and flexible measurement tools. An optimal geometric model of scattered data in a 3D space was constructed by algebraic ellipsoid fitting, and the data were used as fundamental data for calculating the curvature changes of the main reflector. To increase the accuracy of geodetic and astrometrical measurements performed by the VLBI antenna, a program that could periodically calculate the curvature changes of the main reflector with minimum labor and cost was developed

Study Subject and Experimental Configuration
Nontarget-based photogrammetry
Experimental configuration
Geometric modeling of main reflector of VLBI antenna
Enhancement of Fitting Accuracy for Optimal Modeling
Development of Curvature Change Tracking Program
Findings
Conclusions
Full Text
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