Abstract
A method of the determination of concentration profiles of phosphorus in silicon by neutron activation has been elaborated. The lower limit of determination is of the order 10−11 g P. Two groups of errors have been discussed. The suitability of autoradiography to the determination of concentration profiles has been demonstrated. Some applications of the method have been suggested.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Radioanalytical and Nuclear Chemistry Letters
Paper Title
Journal
Date
