Abstract

The recent growth of information-communication facilities such as the Internet, mobile telecommunication and video-on-demand services has led to explosion of worldwide communication traffic, which increase demand for faster and denser communication infrastructures including optical communication networks. Distributed feedback laser diodes (DFB LDs) have been widely used as optical sources in networks because of their high selectivity and stability of wavelength. Although they had limitedly been used in longhaul and high-speed network at one time, they are now increasingly required in metro and end-user fields because of the increasing traffic. Thus, necessity for inexpensive DFB LDs increases rapidly. The characteristics of a DFB LD with uniform (constant period) gratings depend on the grating phase at the cleaved facet (Matsuoka et al., 1984). The variation of characteristics with the facet phase is a serious issue in view of productivity and usability of the LDs. One of the most effective ways of reducing the facet phase effect is to adopt phase-shifted gratings instead of uniform gratings (Kaden et al., 1992). The uniformities of the LD characteristics such as mode-stability and output power are improved by adopting phaseshifted gratings, thus the yield of LDs increase and their production cost is effectively reduced. In general, there are various fabrication methods for diffraction gratings of DFB LDs, for example, interference exposure, electron beam lithography (EBL), and optical projection exposure. Interference exposure cannot feasibly be used for fabricating phase-shifted gratings, because it exclusively generates exposure patterns with a uniform bright-and-dark period. Although EBL has sufficient resolution to be used for phase-shifted gratings, exceedingly expensive apparatus is necessary for volume production with sufficient throughput. For the optical projection method, a forefront stepper having sufficient resolution for gratings is also expensive, and the cost is too high for fabricating DFB LDs, of which production volume is relatively small compared to that of such semiconductor devices as LSIs. Nanoimprint lithography (NIL) has been studied by many organizations since the middle of the 1990s. Chou et al. indicated that sub-10-nm features could be formed by imprint, which started the era of NIL technology (Chou et al., 1995). A novel method of NIL using a UVcurable resin was introduced by Haisma et al (Haisma et al., 1996), and Bailey et al.

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