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Abstract
We discuss and compare the application of static and dynamic operation modes of scanning force microscopy to contact and noncontact imaging. The static modes of force microscopy can image the magnetic stray field of a ferromagnetic sample and separate topographic from magnetic information. Very high measurement speeds, up to one image in 2 s are reached. In comparison measurements in the dynamic modes are slower but have an excellent force gradient sensitivity. We have extended the direct frequency measurement method to frequencies up to 1 MHz achieving a frequency resolution of at least 1/10 Hz. The possibility to measure such high frequencies with good resolution allows us to use very stiff cantilevers and to still achieve an excellent force gradient resolution. Such a stiff cantilever does not jump to the surface, if the sample is approached.
Published Version
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Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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